Dynamic Learning Maps appointed two new members to its Technical Advisory Committee (TAC) last week, bringing the committee's total appointments to nine experts in assessment.
Dynamic Learning Maps™ has announced members of its 2015 Technical Advisory Committee (TAC). This year’s committee includes four new and four returning members. The group will first meet on Wednesday, January 28, to discuss the topics of modeling and standard setting.
The Lawrence Journal-World recently reported on the progress of Dynamic Learning Maps™, a project of the Center for Educational Testing and Evaluation based at the University of Kansas in Lawrence.
We are pleased to announce an updated release of the KITE Client that supports Apple OS X Yosemite. Additionally, this release fixes an application start up issue on Apple OS X Mavericks (10.9.5), which prevented the application from opening.
Dynamic Learning Maps™ is pleased to announce an updated release of the KITE Client for iPads. This release improves the security of the testing environment as well as resolves several error messages. If Automatic Updates are enabled on your iPad, no action is required.
The Achievement and Assessment Institute (AAI) at the University of Kansas has received a $212,000 award from the Bill & Melinda Gates Foundation to develop a web interface for exploring Dynamic Learning Maps.
An updated version of the KITE Client is now available for download. All previous versions should be uninstalled before installing the updated KITE Client. To download the software...
The Dynamic Learning Maps™ Alternate Assessment Consortium is seeking educators from its partner states to review testlets (sets of 3–8 items) for the new assessments. Panelists will review items in fall 2014.
In recent months, Education Week has published several articles that mention or highlight the Dynamic Learning Maps™ (DLM®) Alternate Assessment project, including a guest blog by Project Director Neal Kingston and a pair of stories on alternate assessment choices, implementation, and field tests.